Semiconductor Wafer Test Receives Substantial Boost
Xallent | Jul 8, 2021 ITHACA, NY— Efforts to push the frontiers of nanoscale chip design received a significant boost today when Xallent, a world leader in nanoscale measuring solutions, today announced pre-orders for their next-generation SAKYIWA system, which features probes 1800X smaller than the current market standard. In addition to smaller probes, the Xallent system […]
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