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by Xallent | Jun 18, 2015 National Science Foundation (NSF) awards Xallent with a Phase IB grant to further the development of Xallent’s proprietary scanning probes.

by Xallent | Apr 15, 2015 The NEXUS-NY program has awarded Xallent with Phase II grant to further develop its probing technology for characterization of thin film energy materials.

by Xallent | Jan 24, 2015 Xallent has been awarded a Phase I SBIR grant by the National Science Foundation (NSF) to develop nanomachines for semiconductor device characterization.

by Xallent | Apr 15, 2015 The NEXUS-NY program has awarded Xallent with Phase II grant to further develop its probing technology for characterization of thin film energy materials.

by Xallent | Nov 9, 2014 Xallent participated in the 2014 International Symposium for Testing and Failure Analysis (ISTFA).ttings.

by Xallent | Oct 4, 2014 Xallent is accepted into the StartUP NY Program. START-UP NY helps new and expanding businesses through tax-based incentives and innovative academic partnerships. START-UP NY offers new and expanding businesses the opportunity to operate tax-free for 10 years on or near eligible university or college campuses in New York State. Partnering with these schools

by Xallent | Mar 13, 2014 Xallent participates in the Cornell Center for Material Research’s Industrial Collaboration Program (ICP).

by Xallent | Jan 20, 2014 Xallent signs a contract with the Defense Advanced Research Projects Agency (DARPA) to identify the origin of fabrication of IC chips.