...

Xallent – Advanced Nanoscale Testing Solutions

About Us

.

THE XALLENT STORY

The Metrology Bottleneck

For decades, semiconductor advancement followed a predictable path of scaling. But today, as the industry pivots toward the 2nm node and 3D heterogeneous integration, traditional testing methods have hit a wall. In the time it takes to perform a full lithography cycle just to create test pads, the world has already moved forward. At Xallent, we believe that waiting days for electrical data is a relic of the past. We exist to turn “days” into “minutes.”

Our Mission

Xallent is an advanced semiconductor metrology company dedicated to accelerating the journey from material discovery to high-volume manufacturing. We provide the “eyes” and “ears” for the chiplet era. By combining proprietary MEMS-based fine-pitch probes with powerful computer vision and automation, we empower engineers to see, measure, and validate their most ambitious designs—without the traditional fabrication hurdles.

Engineering the Direct Path

What sets Xallent apart is our “Direct-Contact” philosophy. Whether it is our One HITS™ unified test system or our sub-micron NanoProbers, our technology is designed to interface directly with pristine thin films and micro-scale interconnects. By eliminating the need for sacrificial test pads and chemical-heavy lithography cycles, we protect the integrity of your materials and the velocity of your R&D.

Designed for the Chiplet Era

From the labs of top-tier research universities to the cleanrooms of global foundries, Xallent is the partner of choice for those mastering 2.5D and 3D integration. Our hardware is engineered for the complex world of hybrid bonding, microbumps, and copper pillars—ensuring that the “Known-Good Die” is a certainty, not a guess.

Seraphinite AcceleratorOptimized by Seraphinite Accelerator
Turns on site high speed to be attractive for people and search engines.