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The Xallent System Optimizes
Your Entire Testing Workflow
Faster
Minimize sample prep &
test up to 300X faster
Higher Resolution
Easily test at the nanoscale with
1800X smaller probes
Lower Cost
One low-cost prober replaces
multiple expensive machines
Simpler
Non-oxidizing probes eliminate
time-consuming cleaning
More Applications
Opens new testing horizons
“The Xallent system represents a key milestone for us.”
Ron Olson
Director of Operations | Cornell NanoScale Facility
.
A New World for a World of Tests
DC, High frequency,
and CV Electrical Testing
Mechanical and
AFM Testing
Imaging and
Metrology
Nanoscale Probes Make It Possible
Innovative nano-electro-mechanical-systems (NEMS) and MEMS multi-tip probes enable material and device characterization at the micro and nanoscale, offering unprecedented throughput, versatility, and ease of use. Repeatable, accurate, and fast measurements are enabled by oxidation-resistant probe tips.
One Low-Cost System Unlocks the New Frontier
The Xallent SAKYIWA NanoProber replaces machines costing up to 5X as much and occupying 10X more lab space. It makes current tests faster and new ones possible. Powered by user-friendly, computer vision software, the Xallent system will change the way you approach micro and nano-scale I/V and sheet resistance measurements.
Already Have a Substantial Investment in Testing Equipment?
Use our computer-controlled high precision positioners along with probe heads as a drop-in replacement to expand the capabilities of your wafer probers and microscopes. Our positioners dramatically extend the capabilities to include multi-point probing and imaging capabilities at the micro and nanoscale. New cutting-edge electrical, mechanical, photonics, and structural measurements are enabled by our positioners.
Technology Development Partners
