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Xallent

Products

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Our Modular System Puts You In Control

The Xallent nanoscale probing technology is a revolutionary solution where the elements can be used separately or together. Xallent NanoProbers leverage powerful computer vision and Xallent’s proprietary probes to  enable the rapid extraction of the electrical properties of thin film materials and semiconductor devices at the micro and nano-scale. Our testing solutions could also be used on your existing wafer probers and microscope to reduce your cost of test while adding value.

    Probes

Innovative nano-electro-mechanical -systems (NEMS) and MEMS multi-tip probes enable material and device characterization at the micro and nanoscale, offering unprecedented throughput, versatility, and ease of use. Repeatable, accurate, and fast measurements are enabled by a portfolio of …. 

  Probers

Use the Xallent standalone  NanoProbers to perform I/V and sheet resistance measurements at the micro and nanoscale.The nanoprobers utilize a portfolio of Xallent’s patented fine pitch four point probes to enable researchers and production facilites to gain early actional insights into the electrical properties of thin ….

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