The Xallent nanoscale probing technology is a revolutionary solution where the elements can be used separately or together. Xallent NanoProbers leverage powerful computer vision and Xallent’s proprietary probes to  enable the rapid extraction of the electrical properties of thin film materials and semiconductor devices at the micro and nano-scale. Our testing solutions could also be used on your existing wafer probers and microscope to reduce your cost of test while adding value.