Enabling the future—with Xallent on your current prober: The Xallent Lite-Prober can be used as a drop-in replacement for your current manipulator or positioner. When used with existing wafer probers, the Xallent Lite-Prober dramatically extends the capabilities to include micro and nanoscale probing of devices and thin film materials. It is integrated with a computer controlled precision Z-stage to support fine landing of probe tips to the DUT.

The Lite-Prober enables high-speed extraction of the electrical, mechanical, and photonics properties of semiconductors, thin film materials, light emitting diodes (LEDs), micro-electro-mechanical-systems (MEMS), solid-state devices, and many more at the micro and nanoscale. The Lite-Prober leverages a portfolio of Xallent fine pitch probes to support the following tests, all on one compact positioner:

• DC, RF, and CV tests
• I/V and sheet resistance measurements
• Nanoindentation and mechanical tests

The Xallent Lite-Prober upgrades your workflow in every dimension—expanding your range of testing and making it faster, easier, and at a lower cost.