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Probes
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Your Key to the Nanoscale
Innovative nano-electro-mechanical -systems (NEMS) and MEMS multi-tip probes enable material and device characterization at the micro and nanoscale, offering unprecedented throughput, versatility, and ease of use. Repeatable, accurate, and fast measurements are enabled by a portfolio of oxidation-resistant probe tips. Need a special probe tip? We design and manufacture a portfolio of probes with a full range of probe spacings, tip materials, and radii. In addition to our current portfolio of probes, we work closely with our customers to develop application-specific probes to meet the most challenging testing needs.
Micro & Nanoscale Four Point Probes
Xallent’s micro and nanoscale four point probes directly measure the resistance, sheet resistance, and resistivity of thin film materials and devices. Xallent’s nanoscale resolution even makes it possible to investigate how grain sizes, boundaries, defects, and material composition impact those measurements. Using that detailed information, researchers and yield engineers can quickly optimize material production, reliability, and yields.
Combined with the Xallent NanoProber and software, the four point probes allow quick, extraction of sheet resistance and 4-wire Kelvin resistance of thin film materials and devices at the micro and nanoscale level.
Fine Pitch Parametric Probe Cards
Xallent’s fine pitch parametric probe cards are designed to support the parallel testing of microLEDs and semiconductor back-end-of-line (BEOL) structures such as bumps, pillars, vias, and redistribution layers (RDLs). The parametric probes manufactured by Xallent have dramatically reduced width, pitch, and tip surface area, enabling MEMS and integrated circuit (IC) designs with 40X smaller test pad pitches. Dramatically reducing pad sizes allows for a greater number of test features per test chip resulting in improved die yields, device performance, and reliability.
Need a custom probe card? Xallent offers services in probe design, simulation, manufacturing, packaging, and testing. We have deep experience in custom probe card development for Clients in research, IC chip manufacturing, defense, automotive, and consumer electronics.
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