Use the Xallent standalone NanoProbers to perform I/V and sheet resistance measurements at the micro and nanoscale.The nanoprobers utilize a portfolio of Xallent’s patented fine pitch four point probes to enable researchers and production facilites to gain early actional insights into the electrical properties of thin film materials and devices. Already have substantial investment in testing equipment? Use our Scope-Probers and Lite-Probers to expand the capabilities of your existing wafer probers and microscopes.