NSF Small Business Innovation Research Grant Award Phase II

Conventional characterization and test methods are increasingly ineffective when applied to structures less than 100 nanometers, causing challenges across R&D, process control, and failure analysis. Given slow, complex detection processes, identification of subtle defects typically takes weeks or months following fabrication.  This translates to significant waste as systemic issues can persist untreated across multiple batches. Xallent’s nanomachine probing technology directly addresses these challenges with simple, cost effective, and high speed testing solutions.

“This Phase II grant reaffirms the powerful potential impact of our nanomachine probing technology to address critical testing challenges in the thin film and semiconductor industries. The simple micro- to nanoscale testing paradigm enabled by our technologies will have far reaching commercial and societal impact, magnified by the powerful trends driving science and engineering at the nanoscale across devices, materials, and biological systems. Our technology enables researchers, scientists, and engineers to dramatically cut the time, cost, and complexity of research, development, and production of advanced thin films and semiconductor devices.” said Dr. Kwame Amponsah, Founder and CEO of Xallent.