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Custom Probes
Custom Probes and More …
Custom probe development can take months and even years. Why not leverage our expertise in nano and micro-electro-mechanical-systems (MEMS) to accelerate your work? We offer services in probe card design, manufacturing, packaging, and testing. We have extensive experience with customers in research, IC chip manufacturing, defense, OEMs, and consumer electronics.
Faster turnaround of custom probes reduces operational costs, accelerates research outcomes, and time-to-market
High Frequency Probes
High frequency probes are used to test 5G circuits, identify subsurface defects and voids, as well as measure the permittivity and conductivity of thin film materials. Fine pitch high frequency probes enable the implementation of high frequency circuits with smaller test pads, thus minimizing parasitics while improving device performance.
Prior to probe manufacturing, a high frequency simulation software is used to model probe performance by extracting scattering parameters. Simulation results are used to fine tune probe dimensions and material stack. Proprietary processing techniques are used to manufacture the probes while metrology tools monitor the manufacturing processes. Probes are packaged with appropriate high frequency connectors and tested to meet specifications.
As a trusted partner, we are invested in your success!
Force Feedback Probes
Our force feedback probes are monolithically integrated with sensors to sense when probe tips make initial contact with a DUT or wafer. The force feedback probes could be used in test environments (such as cryogenic and dark box) where vision systems have inadequate resolution to resolve the probe tips. Probes could be designed and manufactured with specific spring constant and probing force.
Let’s build the future together by innovating the future
Nanomachine Probes
As semiconductor devices continue to scale down in size, the electrical performance of these devices has taken on an increased importance. Defects in transistors can render either part or whole IC chips useless. For this reason, the ability to identify and analyze failures during the early stages of IC fabrication can accelerate new product introduction.
Our nanomachine probes are monolithically integrated with sensors, actuators, and a non-oxidizing probe tip. The non-oxidizing and nanoscale tip enable these probes to be used in scanning electron microscopes (SEM) for nanoprobing applications without having to perform the arduous tip cleaning steps. The monolithically integrated sensors allow for force feedback operation of the probe.
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