(Ithaca, May 3, 2019)—Xallent LLC, manufacturer of solutions and equipment for testing semiconductors and thin film materials at the nanoscale, announced today the sale of the DARIUS and SAKYIWA Nanoprobers to the Cornell NanoScale Facility (CNF).

“This is great landmark for our company! After several months of validation and functional demonstrations, the Cornell NanoScale Facility has teamed with the Kavli Institute at Cornell (KIC) to purchase our nanoprobers to allow its user base to more rapidly and economically test semiconductors and thin-film materials in ambient air and vacuum. “We believe our products will advance the research and development of knowledge driven devices and materials with significant impact in health care, defense, and energy,” said Dr. Kwame Amponsah, CEO & Founder, Xallent LLC.
       “The ability to electrically characterize materials and devices within very confined areas on a routine basis will open up new possibilities for exploration for our user community. It has been great to see this startup company innovate and build their business within CNF and now we have the advantage of being the first to be able to make this capability available to the R&D community” said Dr. Donald Tennant, CNF Director of Operations.
      The DARIUS (SEM and Ambient Air based) and SAKYIWA (Ambient Air based) Nanoprobers enable among other things sheet resistance measurements in thin films and semiconductor production applications in ambient or vacuum, for samples with minimum sizes of 200 nanometers by 4 microns.  With its low profile, fast setup and minimized sample preparation requirement, the nanoprobers offer simple, fast and reliable characterization in many thin film and semiconductor test applications. The nanoprobers are programmable and semi-automatic, providing unprecedented high-speed testing with reliable and repeatable measurement results.
      The nanoprobers leverage Xallent’s proprietary nanomachine probes that are designed and fabricated using advanced nano-electro-mechanical-systems (NEMS) technologies, enabling continuously improved scaling to meet future needs of nanoscale technology nodes. Oxidation resistant metals used for the probe tips eliminate the need for in-situ tip cleaning and spring-loaded probe tips support probing of 3D structures.

About Xallent LLC
Xallent LLC designs, develops, manufactures, and markets advanced nanoprobing solutions for imaging, electrical measurement, and testing of thin film materials and semiconductor devices. Our unique nanoprobers and nanomachine probes are used in scanning electron and optical microscopes to more rapidly and economically test semiconductor devices and thin film materials during manufacturing. We understand our customer’s needs, offering fast, simple and affordable solutions to meet specific applications. Our research was funded by NSF, DARPA, NYSERDA, Empire State Development, and FuzeHub.

(Ithaca, May 2, 2019)—Xallent LLC, the manufacturer of solutions and equipment for testing semiconductors and thin film materials at the nanoscale, came third in the BenDaniel Venture Challenge (Cornell Venture Challenge).
As one of the nation’s most active MBA student-run venture capital funds, Big Red Ventures (BRV) has been sponsoring the Cornell Venture Challenge since the year 2009. This March, the BRV fund managers set up stringent judging criteria and ran through 70+ applications of Cornell-affiliated ventures. The purpose of the challenge is to provide an opportunity for burgeoning entrepreneurs to gain experience, exposure, and financing to help develop their business ideas to actionable and high-impact ventures. Winnowing the applications into a list of finalists was a herculean task. The finalists selected for this year represent ideas from different parts of the Cornell community and have the potential to make a lasting impact on the future.

(Ithaca, NY – July 16, 2018)- The Defense Advanced Research Projects Agency (DARPA) under the United States Department of Defense (DoD) has awarded Xallent a Phase I small business and technology transfer (STTR) grant to develop the next generation of advanced nanofabrication and nanoprobing instrumentation to fabricate atomically precise, strongly correlated materials for applications in high efficiency computing. Xallent has teamed up with a world renowned expert in the growth of two dimensional and strongly correlated thin films at Cornell University to validate its technology.

(Ithaca, NY – December 19, 2017)- Grants for Growth is a unique CenterState CEO seed program that supports innovative applied research projects between universities and industry to improve business competitiveness and create jobs. Xallent has partnered with Cornell NanoScale Facility under the Grants for Growth program to develop high speed nanoprobing platforms to rapidly test semiconductors and thin film materials.

(Albany, NY – March 1, 2017) — FuzeHub, a not-for-profit organization responsible for assisting small to medium-sized manufacturing companies (SMEs) in New York State by matching them with technical and business resources, recently launched the Jeff Lawrence Manufacturing Innovation Fund. The Cornell NanoScale Facility (CNF) at Cornell University has partnered with Xallent LLC  through the Manufacturing Innovation Fund to develop a next generation diagnostic tool to more rapidly and economically test and characterize semiconductor devices and thin film materials during manufacturing. This tool is built on Xallent’s innovative nanoscale imaging and probing technology. The ability to rapidly probe and measure electrical components at the nanoscale for diagnostics and failure analysis non-destructively is expected to tap a broad range of industry applications. The Manufacturing Innovation Grant will be used to adapt Xallent’s nanomachine platforms to analytical instruments at the Cornell NanoScale Facility for validation, user interface focus, and reliability studies.