About

Innovative Nanoscale Testing Solutions

Xallent develops proprietary nanoscale measurement hardware and software tools for imaging, testing, and analyzing semiconductors and thin film materials. Based on trailblazing discoveries at Cornell University and its own subsequent innovations, Xallent semiconductor test adapter cards and systems utilize novel nanomachine test probes. Xallent nanoprobe test cards offer reduced capital investments, shorter setup and testing cycle times, and lower support costs than existing solutions.

Timeline of Company

May 2019:
THE SALE OF THE DARIUS AND SAKYIWA NANOPROBERS

Xallent LLC accomplished the sale of the DARIUS and SAKYIWA Nanoprobers to the Cornell NanoScale Facility (CNF)
Jul 2018
DARPA
The Defense Advanced Research Projects Agency (DARPA) awarded Xallent a Phase I small business technology transfer (STTR) grant to explore the technical feasibility of developing advanced nanofabrication and nanoprobing instrumentation to fabricate atomically precise strongly correlated materials for applications in high efficiency computing.

Jul 2018
Feb 2018
Installation of Alpha Model
Xallent installs the alpha model of its nanoprobing platform at the Cornell NanoScale Facility for user trials and pre-purchase evaluation.
Jan 2017
Cornell University Partnership
Xallent partners with Cornell University under a New York State manufacturing innovation grant administered by FuzeHub to develop diagnostic nanoprobing solutions to rapidly and economically test semiconductors and thin film materials during manufacturing.

Jan 2017
Jan 2017
Brookhaven/Sandia Partnership

Xallent partners with two top Department of Energy national laboratories, Brookhaven National Laboratory and Sandia National Laboratory, to develop innovative nanoprobes to characterize thin film materials.
Oct 2016
NSF SBIR Phase II

Xallent is awarded a National Science Foundation SBIR Phase II grant to further development of its nanomachine probing technology.

Oct 2016
Mar 2015
Semiconductor Foundry
Xallent signs an NDA with a major semiconductor foundry and begins to work with its engineers to develop custom probes geared toward testing their memory devices. The work with the foundry resulted in the development of a portfolio of probes that are currently being marketed by Xallent.
Jan 2015
NEXUS-NY

Xallent participates in the NEXUS-NY program to refine its value proposition as well as embark on a customer discovery process. Through this program, Xallent interviewed over 55 potential customers, and feedback received on its technology was unilaterally positive.

Jan 2015
Dec 2014
NSF SBIR

Building on the work carried out for DARPA, Xallent competes for and is awarded a National Science Foundation SBIR grant to develop nanomachines to rapidly perform failure analysis of advanced node semiconductor devices.
Jan 2014
Contract with DARPA

Xallent proposes to use its nanomachine to identify the origin of fabrication of integrated circuits and was awarded a Phase I small business innovation grant to tackle a complex national security problem for the United States government. This grant was very instrumental to the survival of Xallent!

Jan 2014
July 2013
Company Founded

Right after graduating from Cornell University with a doctoral degree in electrical and computer engineering, Dr. Kwame Amponsah founded Xallent, LLC with guidance from his academic advisor Dr. Amit Lal and high tech executive Dr. Ashish Kumar to commercialize a nanomachine probing technology that he co-invented as part of his doctoral work. Thanks to the American tax payers, National Science Foundation and Army Research Laboratory for supporting his doctoral work.