Xallent
  • Home
  • Products
    • Probes
    • DARIUS Nanoprober
  • Company
    • About Us
    • Career
    • News
  • Contact
  • Search
  • Menu

About

Innovative Nanoscale Testing Solutions

Xallent develops proprietary nanoscale measurement hardware and software tools for imaging, testing, and analyzing semiconductors and thin film materials. Based on trailblazing discoveries at Cornell University and its own subsequent innovations, Xallent semiconductor test adapter cards and systems utilize novel nanomachine test probes. Xallent nanoprobe test cards offer reduced capital investments, shorter setup and testing cycle times, and lower support costs than existing solutions.

Timeline of Company

  • Jul 2018

    DARPA

    The Defense Advanced Research Projects Agency (DARPA) awarded Xallent a Phase I small business technology transfer (STTR) grant to explore the technical feasibility of developing advanced nanofabrication and nanoprobing instrumentation to fabricate atomically precise strongly correlated materials for applications in high efficiency computing.

  • Feb 2018

    Installation of Alpha Model

    Xallent installs the alpha model of its nanoprobing platform at the Cornell NanoScale Facility for user trials and pre-purchase evaluation.

    Feb 2018

  • Jan 2017

    Cornell University Partnership

    Xallent partners with Cornell University under a New York State manufacturing innovation grant administered by FuzeHub to develop diagnostic nanoprobing solutions to rapidly and economically test semiconductors and thin film materials during manufacturing.

  • Jan 2017

    Brookhaven/Sandia Partnership


    Xallent partners with two top Department of Energy national laboratories, Brookhaven National Laboratory and Sandia National Laboratory, to develop innovative nanoprobes to characterize thin film materials.

    Jan 2017

  • Oct 2016

    NSF SBIR Phase II


    Xallent is awarded a National Science Foundation SBIR Phase II grant to further development of its nanomachine probing technology.

  • Mar 2015

    Semiconductor Foundry

    Xallent signs an NDA with a major semiconductor foundry and begins to work with its engineers to develop custom probes geared toward testing their memory devices. The work with the foundry resulted in the development of a portfolio of probes that are currently being marketed by Xallent.

    Mar 2015

  • Jan 2015

    NEXUS-NY

    Xallent participates in the NEXUS-NY program to refine its value proposition as well as embark on a customer discovery process. Through this program, Xallent interviewed over 55 potential customers, and feedback received on its technology was unilaterally positive.

  • Dec 2014

    NSF SBIR


    Building on the work carried out for DARPA, Xallent competes for and is awarded a National Science Foundation SBIR grant to develop nanomachines to rapidly perform failure analysis of advanced node semiconductor devices.

    Dec 2014

  • Jan 2014

    Contract with DARPA

    Xallent proposes to use its nanomachine to identify the origin of fabrication of integrated circuits and was awarded a Phase I small business innovation grant to tackle a complex national security problem for the United States government. This grant was very instrumental to the survival of Xallent!

  • July 2013

    Company Founded

    Right after graduating from Cornell University with a doctoral degree in electrical and computer engineering, Dr. Kwame Amponsah founded Xallent, LLC with guidance from his academic advisor Dr. Amit Lal and  high tech executive Dr. Ashish Kumar  to commercialize a nanomachine probing technology that he co-invented as part of his doctoral work. Thanks to the American tax payers, National Science Foundation and Army Research Laboratory for supporting his doctoral work.

    July 2013

© Copyright - Xallent | Website Designed by Authentic Imaging
  • Privacy Policy
Scroll to top
Close