Sheet Resistance Measurements . Knowledge Driven materials engineering at the micro and nanoscale Semiconductor manufacturing processes such as lithography, etching, and metal deposition could affect the electrical properties of pristine thin film materials. Xallent’s direct-probing solutions address these problems by enabling researchers and yield engineers to gain early actionable insights into material properties, boost confidence levels […]
Probing of microLEDs . Gain Early Insights into the performance of microLEDs As computing is increasingly embedded into daily life across smartphones, gaming, augmented reality, and virtual reality, there is constant demand for smaller, sharper, and more energy-efficient screens. Since display components are typically the largest energy consumers in mobile devices, there is enormous pressure to
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Applications coming up Four Point Probe Four Point Probe WATCH VIDEO FOLLOW THE STEP BY STEP GUIDE Probes NanoProbers Scope-Probers Lite_Probers About US . Xallent Inc. Designs, Develops, Manufactures, and Markets the World’s Most Advanced Hardware and Software Tools for Micro and Nanoscale Probing Measurements.$ Button -1 Button 2 Button 1 OR Button 2 Click
Lite-Prober Probes NanoProbers Scope-Probers . Enabling the future—with Xallent or your current equipment Enabling the future—with Xallent on your current prober: The Xallent Lite-Prober can be used as a drop-in replacement for your current manipulator or positioner. When used with existing wafer probers, the Xallent Lite-Prober dramatically extends the capabilities to include micro and nanoscale probing of devices
Scope-Prober Probes NanoProbers Lite-Probers . Expand the capabilities of your microscope The Scope-Prober (patent pending) quickly and easily converts optical microscopes into highly-automated wafer probers. Utilize your existing optical microscopes to perform wafer probe tasks. The Scope-Prober attaches to the microscope’s objective lens and utilizes a portfolio of Xallent’s patented MEMS probes. It is integrated with
NanoProber Probes Scope-Probers Lite-Probers . Unlock the Power of the Xallent System Sheet Resistance: Sheet resistance provides insights into the electrical properties of conducting and semiconducting thin film materials. It is a measure of the resistance across a thin square of a material. Because it is independent of the size of the square, it serves as a
Probers Use the Xallent standalone NanoProbers to perform I/V and sheet resistance measurements at the micro and nanoscale.The nanoprobers utilize a portfolio of Xallent’s patented fine pitch four point probes to enable researchers and production facilites to gain early actional insights into the electrical properties of thin film materials and devices. Already have substantial investment in testing equipment? Use
Probes NanoProbers Scope-Probers Lite-Probers . Your Key to the Nanoscale Innovative nano-electro-mechanical -systems (NEMS) and MEMS multi-tip probes enable material and device characterization at the micro and nanoscale, offering unprecedented throughput, versatility, and ease of use. Repeatable, accurate, and fast measurements are enabled by a portfolio of oxidation-resistant probe tips. Need a special probe tip? We
Products Probes NanoProbers Scope-Probers Lite-Probers . Our Modular System Puts You In Control The Xallent nanoscale probing technology is a revolutionary solution where the elements can be used separately or together. Xallent NanoProbers leverage powerful computer vision and Xallent’s proprietary probes to enable the rapid extraction of the electrical properties of thin film materials and semiconductor
